Zhu Zhangming | School of Microelectronics, Xidian University
スポンサーリンク
概要
関連著者
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Zhu Zhangming
School of Microelectronics, Xidian University
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YANG Yintang
School of Microelectronic, Xidian University
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Liu Xiaoxian
School of Microelectronics, Xidian University
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Gu Huaxi
School of Telecommunications Engineering, Xidian University
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Ding Ruixue
School of Microelectronics, Xidian University
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Wang Fengjuan
School of Microelectronics, Xidian University
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Luo Jun
School Of Material Eng. Soochow University
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Hao Yue
School of Microelectronics, Xidian University
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Chen Haoran
School of Microelectronics, Xidian University
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Liu Lianxi
School of Microelectronics, Xidian University
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ZHAO Yang
School of Communication Engineering, Jilin University
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Wang Jingmin
School of Microelectronics, Xidian University
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Yang Zheng
School of Microelectronics, Xidian University
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Wang Jingyu
School of Microelectronics, Xidian University
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Yu Guangwen
School of Microelectronics, Xidian University
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Yang Yintang
School of Microelectronics, Xidian University
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Deng Shijie
School of Microelectronics, Xidian University
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Zhuang Haoyu
School of Microelectronics, Xidian University
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Liang Liang
School of Microelectronics, Xidian University
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Yang Lin'an
School of Microelectronics, Xidian University
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Li Yanhong
School of Microelectronics, Xidian University
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Li Yani
School of Microelectronics, Xidian University
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Yang Linan
School of Microelectronics, Xidian University
著作論文
- A fast-locking low-jitter pulsewidth control loop for high-speed pipelined ADC
- A CMOS OTA with Extremely Large DC Open-loop Voltage Gain
- Reduction of Signal Reflection in High-Frequency Three-Dimensional (3D) Integration Circuits
- A new stereo enhancement circuit for class-D amplifier
- The impact of trapping centers on AlGaN/GaN resonant tunneling diode
- Thermo-mechanical performance of Cu and SiO2 filled coaxial through-silicon-via (TSV)
- Analytical models for the thermal strain and stress induced by annular through-silicon-via (TSV)
- A Highly Efficient Interface Circuit for Ultra-Low-Voltage Energy Harvesting
- Erratum: The impact of trapping centers on AlGaN/GaN resonant tunneling diode [IEICE Electronics Express Vol. 10 (2013) No. 19 pp. 20130588]