Wang Fengjuan | School of Microelectronics, Xidian University
スポンサーリンク
概要
関連著者
-
Liu Xiaoxian
School of Microelectronics, Xidian University
-
Zhu Zhangming
School of Microelectronics, Xidian University
-
YANG Yintang
School of Microelectronic, Xidian University
-
Ding Ruixue
School of Microelectronics, Xidian University
-
Wang Fengjuan
School of Microelectronics, Xidian University
著作論文
- Reduction of Signal Reflection in High-Frequency Three-Dimensional (3D) Integration Circuits
- Thermo-mechanical performance of Cu and SiO2 filled coaxial through-silicon-via (TSV)
- Analytical models for the thermal strain and stress induced by annular through-silicon-via (TSV)