Remarks on the Method for Measuring Ion Beam Profiles
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概要
- 論文の詳細を見る
Some conditions necessary for correctly measuring ion beam profiles by a transverse electric field are described. The most important is uniformity of the field. Gain uniformity on the first dynode surface of an electron multiplier used as the detector is also important. Fringing field effect can be safely ignored. The way of deducing the original profile by deconvolution of the measured intensity distribution curve proved to be satisfactorily accurate.
- 日本質量分析学会の論文
著者
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Inouye Hokotomo
Research Institute For Scientific Measurements
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NIURAO KENICHI
Research Institute for Scientific Measurements, Tohoku University
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