Study on Automatic Control of Sliver Thickness by High-Frequency Small Capacitance MesuringPrinciple:Part 1 : Constitution of the Automatic Controller and Properties of the Detecting Means
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The automatic controller under this study is bult of the following apparatus:<BR>Process- Intersecting gill box.<BR>Detecting Means- High-frequency small capacitance measuring equipment. (Uster evenness tester)<BR>Final control element- Electric-oil pressure power actor. Positive, infinitely variable speed chain gear box.<BR>Control means- PID controller<BR>The major causes for variations in the static properties of the detecting means are:<BR>(1) Make-up of the measuring condenser.<BR>(2) Amplification degree of the measuring equipment.<BR>(3) Dielectric constant of the fibers in a measured sliver.<BR>(4) Moisture content of the fibers in the sliver measured.<BR>(5) Deviation of the adjusted point.<BR>The adjusted point is a point where the two frequencies of the oscillators in the adapter coincide when nothing is contained in the measuring condenser. This point shifts by variations in the temperature and relative humidity of the room.<BR>The time constant of the detecting means is about 0.20 sec in normal and 1.6 sec in inert.
- 社団法人 日本繊維機械学会の論文
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- Study on Automatic Control of Sliver Thickness by High-Frequency Small Capacitance MesuringPrinciple:Part 1 : Constitution of the Automatic Controller and Properties of the Detecting Means
- Study on Automatic Control of Sliver Thickness by High Frequency Small Capacitance Mleasuring Principle:Part 2 : Measurement and Consideration of the Static Property of Detecting Means