Study on Automatic Control of Sliver Thickness by High Frequency Small Capacitance Mleasuring Principle:Part 2 : Measurement and Consideration of the Static Property of Detecting Means

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We measured the static property of detecting parts under different conditions, and sought equationsby to determine the static property and obtained, the following results : (1) A zero point sliver thickness G0 (the sliver thickness in the measuring condenser when the indicative meter of the measuring equipment indicates zero is calculable by the following equation : G0=k1/r=k2 (d0-d) where k1 and k2 are constants, determined by the kind of fiber and costruction of the measuring condenser ; and r is the moisture content of the sliver measured ; d is the declination of the adjustment terminal on the adapter from the adjustment point, and do is the zwro point declination of the adjustment terminal from the adjustment point (The value converted into the capacitance variation of the measuring condenser from the state of in to the indicate meter indicating to zero the declinations of the adjustment terminal from the adjustment point) and it is calsulated by the following equation : d0=1.099×104/14-Av (12+Am) Ar where Av Am are amplifications of the equipment. (2) The ajustment point varies very largely by the temoertature of the room, so it is not fit to use this equipment directly as the detecting part.
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