Ni内部電極積層セラミックコンデンサの信頼性に及ぼすSiO2の影響

概要

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Degradation behavior of insulation resistance of BaTiO3 based Ni-electrode multilayer ceramic capacitors has been studied with special reference to the dielectric composition and grain boundary chemistry. The degradation behavior shows clear dependence on A/B of grain boundary layer. It is shown that SiO2 extracts BaO and Cat) from (Ba1-XCaXO)m(Ti1-YZrYO2) and then A/B of grain boundary layer become less than the unity. We have developed high capaci-tance multilayer ceramic capacitors as 10.5μF in 3216 type with superior reliability, using newly developed dielectric material, (BaO)m(Ti1-YZrYO2)+aMnO+bY2O3+cV2O5+dWO3 (Y=0.18, m=1.004, a=0.2wt%, b=0.3wt%, c=0.04wt%, d=0.05wt%).