A CMOS Built-In Current Sensor for IDDQ Testing(Integrated Electronics)

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概要

• 論文の詳細を見る

• This paper presents a new built-in current sensor (BICS) that detects defects using the current testing technique in CMOS integrated circuits. The proposed circuit is a negligible impact on the performance of the circuit under test (CUT). In addition, no extra power dissipation and high-speed fault detection are achieved. It can be applicable in deep submicron process. The area overhead of the BICS versus the entire chip is about 9.2%. The chip was fabricated with Hynix 0.35μm standard CMOS technology.

• 社団法人電子情報通信学会の論文
• 2006-06-01

著者

• Kim Jeong

  Kangwon National Univ. Kangwon Kor

• Hong Seung

  Dept. Of Electronincs Engineering Kangwon National University

• Kim Jeong

  Dept.of Obstetrics & Gynecology, Catholic University Medical College

• Kim Jeong

  Dept. Of Arch. Eng'g Kyung Hee University

• Hong Seung

  Dept. Of Electronics Inha Univ.

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