Dynamical Aspects of Retention and its Relation to Fatigue in Ferroelectric Thin Films
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2002-11-30
著者
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Yoon J‐g
Seoul National Univ. Seoul Kor
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Yoon Jong-gul
Center For Oxide Electronics And School Of Physics Seoul National University:department Of Phy Ics U
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SONG Tae
Department of Ceramic Science and Engineering, Department of Physics, Changwon National University
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Noh T
Seoul National Univ. Seoul Kor
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Noh Tae
Center For Oxide Electronics And School Of Physics Seoul National University
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Song Tae
Department Of Ceramic Science And Engineering Changwon National University
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Seo S.
School Of Physics And Research Center For Oxide Electronics Seoul National University
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KANG Bo
School of Physics and Research Center for Oxide Electronics, Seoul National University
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YOON Jong-Gul
School of Physics and Research Center for Oxide Electronics, Seoul National University
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SEO Sunae
School of Physics and Research Center for Oxide Electronics, Seoul National University
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SO Ye
School of Physics and Research Center for Oxide Electronics, Seoul National University
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NOH Tae
School of Physics and Research Center for Oxide Electronics, Seoul National University
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So Ye
School Of Physics And Research Center For Oxide Electronics Seoul National University
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Kang B.
School Of Physics And Research Center For Oxide Electronics Seoul National University
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Noh Tae
School of Electrical Engineering, Pukyong National University, Busan 608-737, Korea
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NOH Tae
School of Electrical Engineering, Pukyong National University
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