Radiation Hardness Test of a Silicon Strip Detector by Electron Beam Irradiation(I. Nuclear Physics)

概要

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A single-sided n-type silicon strip detector (SSD) was directly irradiated by an electron beam in order to examine the radiation hardness. The SSD has been developed as a focal plane detector of the electron spectrometer for the (e, e'K^+) experiment at Jefferson Laboratory. Since the counting rate is as high as 2×10^8 [Hz] for the focal plane size of 70 cm, the degradation due to the radiation is one of the most serious problems. Leakage currents linearly increased by the fluence until the maximum fluence of 5×10^<14>/cm^2 Although the efficiency began to drop at 2×10^<14>/cm^2, it was recovered up to 3×10^<14>/cm^2 by increasing the bias to 150 V. Noise figures slightly increased but within the acceptable level. From the results, the SSD was confirmed to be operated without any degradation of the performance for a long period under high-counting environment.
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