Beam Irradiation Test for Focal Plane SSD at Jefferson Lab(I. Nuclear Physics)

概要

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Radiation hardness was investigated for a silicon strip detector (SSD) to be used as a focal plane detector of the scattered electron spectrometer in a series of experiments at Jefferson Lab. for hypernuclear spectroscopy by the (e, e' K^+) reaction. The SSD was irradiated up to the dose of 150 kGy with a 200 MeV electron beam at the low energy tagged photon facility of Laboratory of Nuclear Science. After the irradiation, only slight increase of the noise level was observed, although the leak current increased linearly with the dose. It was confirmed that the SSD can be operated without any serious degradation of the performance under expected dose of 10-15 kGy during the 3 months experiment.
東北大学の論文