Current Dependency of the Noise in Space-Charge-Limited Solid-State Diodes
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概要
- 論文の詳細を見る
Experimental evidence shows that the noise current is proportional to 1/2 power of the current I in the limiting white noise region and to 3/2 power of current I in the 1/f noise region for laboratory-made SCL diodes, The noise analysis is carried out as for a FET. The limiting white noise level agrees quantitatively with the thermal noise level analyzed in this paper, while the 1/f noise agrees qualitatively with the analytical result derived from Hooge's empirical expression.
- 社団法人応用物理学会の論文
- 1981-10-05
著者
-
Kaku Yasuhiko
Department Of Electronics Kyushu Institute Of Technology
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Takagi Keiji
Department of Chemical Science and Engineering, Faculty of Engineering, Kobe University
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