Electrochromic Memory Degradation in WO_x-LiClO_4/PC Cells
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概要
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Electrochromic memory degradation in Li_yWO_x has been investigated. When the external circuit connection has a resistor, which is important for a practical display use, the degradation mechanism has been explained by the capacitor discharge model. This model presents an estimation method for determining capacitance and EMF (electromotive force) for a cell. In the case of an open circuit, it has been proved that the simple diffusion theory could be adopted. Several factors, which improve the electrochromic open-circuit memory, have been considered.
- 社団法人応用物理学会の論文
- 1982-04-20
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