Selective Embedded Growth of Al_xGa_<1-x>As by Low-Pressure Organometallic Vapor Phase Epitaxy
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概要
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Selective embedded growth of Al_xGa_<1-x>As (X≤0.35) in grooves of patterned substrates has been achieved for the first time by low-pressure organometallic vapor phase epitaxy (LP-OMVPE). Epitaxial Al_xGa<1-x>As layers are embedded only in chemically etched grooves, while no polycrystalline deposition occurs on the masked area. The layers grown in grooves with the reverse-mesa cross sections, formed in the [110] direction, are uniform in thickness and show flat-smooth surfaces throughout. These results indicate that LP-OMVPE is a very promising technique for monolithic device integration.
- 社団法人応用物理学会の論文
- 1986-01-20
著者
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TAKAGISHI Shigenori
Optoelectronics Joint Research Laboratory
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KAMON Koichi
Optoelectronics Joint Research Laboratory
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MORI Hideki
Optoelectronics Joint Research Laboratory
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