Magnetic Domain Structures in CoCr Films Studied by Lorentz Microscopy
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概要
- 論文の詳細を見る
Magnetization distribution and behavior of magnetization in CoCr sputtered films of various thickness are studied by high-resolution Lorentz microscopy. The perpendicular component of magnetization increases with increasing film thickness, corresponding to the increase in the Q-value. The dominant mechanism of magnetization reversal changes from the domain wall displacement mode in the 200 Å thick film to the rotational mode in the 1000 Å thick film. In the 600 Å thick film, elongated domains with a kind of cross-tie walls are formed perpendicular to an AC demagnetizing field in the film plane.
- 社団法人応用物理学会の論文
- 1983-03-20
著者
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OHKOSHI Masatoshi
Department of Applied Physics, School of Science and Engineering, Waseda University
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KUSUDA Tetsuzo
Department of Electronics, Faculty of Engineering, Hiroshima University
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Kusuda Tetsuzo
Department Of Electronics Faculty Of Engineering Hiroshima University
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Ohkoshi Masatoshi
Department Of Electronics Faculty Of Engineering Hiroshima University
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Ohkoshi Masatoshi
Department Of Applied Physics School Of Science And Engineering Waseda University
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