AuAl_2 Thin Film Resistors for Josephson Integrated Circuits

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1982-11-20

著者

• Imamura Takeshi

  Fujitsu Ltd.

• Hasuo Shinya

  Fujitsu Laboratories Ltd.

• SHIBAYAMA Hikou

  Fujitsu Ltd.

• Shibayama Hikou

  Fujitsu Laboratories Ltd.

• MOROHASHI Shin'ichi

  Fujitsu Ltd.

関連論文

• Fabrication of DC-SQUIDs and Their Characteristics for Digital Applications : C-2: JOSEPHSON DEVICES
• AuAl_2 Thin Film Resistors for Josephson Integrated Circuits
• 5.6 ps Gate Delay All Refractory Josephson OR Gate with Modified Variable Threshold Logic
• Schottky Barrier Height of Al n-In_Ga_As and Nb/n-In_Ga_As Diodes
• Current Injection Effects in a Nb/AlO_x-Al/Nb/n-InSb Triode
• 9 ps Gate Delay Josephson OR Gate with Modified Variable Threshold Logic
• Measurement of Grey Zone of a Josephson SFQ Memory Cell
• Reactive Sputter Etching System with Floating Grid : A-1: ADVANCED LITHOGRAPHY AND PROCESS

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