Annealing out of Thermal Process-Induced Defects at InP(110) Surfaces-A Novel Method
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1991-11-15
著者
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Spicer William
Stanford Electronics Laboratories Stanford University
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YAMADA Masao
Stanford Electronics Laboratories, Stanford University
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GREEN Albert
Stanford Electronics Laboratories, Stanford University
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HERRERA-GOMEZ Alberto
Stanford Electronics Laboratories, Stanford University
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KENDELEWICZ Tom
Stanford Electronics Laboratories, Stanford University
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Yamada M
Sony Corp. Tokyo Jpn
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Green Albert
Stanford Electronics Laboratories Stanford University
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Herrera-gomez Alberto
Stanford Electronics Laboratories Stanford University
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Kendelewicz Tom
Stanford Electronics Laboratories Stanford University
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Yamada Masao
Stanford Electronics Laboratories Stanford University:fujitsu Ltd.
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