Charged State Control for Organic Domain Structure by Atomic Force Microscope

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概要

• 論文の詳細を見る

• Nanometer-scale domain structures of organic molecules were fabricated on the SiO_2 substrates. The electric charges were injected into the single domain by the contact electrification process using a tip of Atomic Force Microscope. We observed the charge distribution by mapping the surface potential two-dimensionally, and found that the injected charges were stably stored in the isolated domain. The number of injected charges depended on the tip bias during contact, and we succeeded in injecting and imaging only a few elementary charges.

• 社団法人応用物理学会の論文
• 1995-07-01

著者

• Gemma N

  Toshiba Corp. Kawasaki Jpn

• Tanaka Kuniyoshi

  Toshiba R&d Center

• Hieda H

  Toshiba Corp. Kawasaki Jpn

• Egusa Syun

  Toshiba Research & Development Center Advanced Research Laboratory

• GEMMA Nobuhiro

  Toshiba Research & Development Center, Advanced Research Laboratory

• HIEDA Hiroyuki

  Toshiba Research & Development Center, Advanced Research Laboratory

関連論文

• A Tip Approach System for a Scanning Tunneling Microscope Using an Inchworm
• Charged State Control for Organic Domain Structure by Atomic Force Microscope
• Analysis on Electrostatic Tip-Sample Interaction in Aqueous Solution under Potentiostatic Condition
• Electrical Double-Layer Forces Measured with an Atomic Force Microscope while Electrochemically Controlling Surface Potential of the Cantilever
• Measurements of Electrostatic Double-Layer Forces Due to Charged Functiornal Groups on Langmuir-Blodgett Films with an Atomic Force Microscope
• Carrier Injection Characteristics of Organic Electroluminescent Devices

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