Measurements of Electrostatic Double-Layer Forces Due to Charged Functiornal Groups on Langmuir-Blodgett Films with an Atomic Force Microscope

スポンサーリンク

概要

• 論文の詳細を見る

• Using an atomic force microscope, we measured the forces between a Si_3N_4 tip and monolayers with different polar functional groups (-NH_2, -COOH, -C0NH_2, and -OH) prepared by the Langmuir-Blodgett method while varying the pH value of aqueous solutions. The obtained force vs distance curves were related to the surface charges of the tip and the dissociation of the functional groups from the pH dependency, and the charged state of functional groups could thus be discerned. In addition, the electrostatic origin of the force has been confirmed assuming constant potentials on both surfaces.

• 社団法人応用物理学会の論文
• 1994-08-15

著者

• Gemma N

  Toshiba Corp. Kawasaki Jpn

• Gemma Nobuhiro

  Advanced Research Laboratory Toshiba Corporation

• Ishino Takashi

  Advanced Research Laboratory Toshiba Research And Development Center

• Hieda H

  Toshiba Corp. Kawasaki Jpn

• Hieda Hiroyuki

  Advanced Research Laboratory, Toshiba Research and Development Center

• Tanaka Kuniyoshi

  Advanced Research Laboratory, Toshiba Research and Development Center

関連論文

• Competition between Electrostatic and Capillary Forces Acting on a Single Particle
• Charged State Control for Organic Domain Structure by Atomic Force Microscope
• Analysis on Electrostatic Tip-Sample Interaction in Aqueous Solution under Potentiostatic Condition
• Electrical Double-Layer Forces Measured with an Atomic Force Microscope while Electrochemically Controlling Surface Potential of the Cantilever
• Measurements of Electrostatic Double-Layer Forces Due to Charged Functiornal Groups on Langmuir-Blodgett Films with an Atomic Force Microscope
• Symmetry Studies of Antiferromagnetic Heisenberg Model
• Carrier Injection Characteristics of Organic Electroluminescent Devices

スポンサーリンク