Electrical Double-Layer Forces Measured with an Atomic Force Microscope while Electrochemically Controlling Surface Potential of the Cantilever

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概要

• 論文の詳細を見る

• The atomic force microscope was used to detect electrostatic forces and estimate surface potentials of samples in aqueous solution by applying voltage to a conducting tip. We controlled surface potential of a Au-coated cantilever electrochemically, and measured force vs distance curves on monolayers with different kinds of functional groups. As a result, we detected force variation with applied voltage to the tip, and the direction of force variation was found to agree with the polarity of surface charges due to the dissociation of the functional groups.

• 社団法人応用物理学会の論文
• 1994-11-01

著者

• Gemma N

  Toshiba Corp. Kawasaki Jpn

• Gemma Nobuhiro

  Advanced Research Laboratory Toshiba Corporation

• Ishino Takashi

  Advanced Research Laboratory Toshiba Research And Development Center

• Hieda H

  Toshiba Corp. Kawasaki Jpn

• Hieda Hiroyuki

  Advanced Research Laboratory, Toshiba Research and Development Center

• Tanaka Kuniyoshi

  Advanced Research Laboratory, Toshiba Research and Development Center

関連論文

• Competition between Electrostatic and Capillary Forces Acting on a Single Particle
• Charged State Control for Organic Domain Structure by Atomic Force Microscope
• Analysis on Electrostatic Tip-Sample Interaction in Aqueous Solution under Potentiostatic Condition
• Electrical Double-Layer Forces Measured with an Atomic Force Microscope while Electrochemically Controlling Surface Potential of the Cantilever
• Measurements of Electrostatic Double-Layer Forces Due to Charged Functiornal Groups on Langmuir-Blodgett Films with an Atomic Force Microscope
• Symmetry Studies of Antiferromagnetic Heisenberg Model
• Carrier Injection Characteristics of Organic Electroluminescent Devices

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