Carrier Injection Characteristics of Organic Electroluminescent Devices

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概要

• 論文の詳細を見る

• The junction characteristics of metal/organic (M/Org) and organic/organic (Org/Org) interfaces, composing an organic electroluminescent (EL) device, M/Alq3/Diamine/ITO, were studied by measuring the displacement current characteristics of M/Org/Org/SiO_2/Si structures. The M/Alq3 junction was found to be both electron and hole injective, depending on the metal electrode. As for the Alq3/Diamine interface, it was found that two band offsets (Φ_<VB> and Φ_<CB>) existed for respective valence and conduction bands. Φ_<VB> was not very large, and holes in Diamine were able to pass through into the adjacent Alq3 layer by applying a forward-bias, but Φ_<CB> was so large that the electrons in Alq3 were blocked. Based on the standpoint that characteristics of the organic thin-film devices are governed by those junctions, we discussed carrier-injection mechanism, and explain the efficient EL emission.

• 社団法人応用物理学会の論文
• 1994-05-15

著者

• Gemma N

  Toshiba Corp. Kawasaki Jpn

• Gemma Nobuhiro

  Advanced Research Laboratory Toshiba Corporation

• Egusa S

  Toshiba Corp. Kawasaki Jpn

• Egusa Syun

  Advanced Research Laboratory Research And Development Center Toshiba Corp.:(present Address)cambridg

• Azuma M

  Materials And Devices Laboratories Toshiba Research And Development Center

• MIURA Akira

  Materials and Devices Laboratories, Toshiba Research and Development Center

• AZUMA Makoto

  Materials and Devices Laboratories, Toshiba Research and Development Center

• Miura Akira

  Materials And Devices Laboratories Toshiba Research And Development Center

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• Electrical Double-Layer Forces Measured with an Atomic Force Microscope while Electrochemically Controlling Surface Potential of the Cantilever
• Measurements of Electrostatic Double-Layer Forces Due to Charged Functiornal Groups on Langmuir-Blodgett Films with an Atomic Force Microscope
• Carrier Injection Characteristics of Organic Electroluminescent Devices

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