A Two-Pass Excimer Laser Annealing Process to Control Amorphous Silicon Crystallization

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Numerical Analysis of the Electrical Characteristics of Gate Overlapped Lightly Doped Drain Polysilicon Thin Film Transistors
A Two-Pass Excimer Laser Annealing Process to Control Amorphous Silicon Crystallization
Pd-Gate a-Si:H Thin-Film Transistors as Hydrogen Sensors
Source-Drain Metal Contact Effects in Short-Channel a-Si:H Thin-Film Transistors
Theoretical Analysis of a-Si:H Based Multilayer Structure Thin Film Transistors

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