Recrystallization Dynamics of Phase Change Optical Disks with a Nitrogen Interface Layer
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2000-02-28
著者
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Kurz H
Rwth Aachen Aachen Deu
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Kurz H
Institute Of Semiconductor Electronics Ii Rheinisch-westfailsche Technische Hochschule Sommerfeldstr
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TRAPPE Cyril
Institute of Semiconductor Electronics II, Rheinisch-Westfailsche Technische Hochschule, Sommerfelds
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BECHEVET Bernard
Laboratoir d'Electronique de Technologie et d'Instrumentation
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HYOT Berangere
Laboratoir d'Electronique de Technologie et d'Instrumentation
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WINKLER Olaf
Institute of Semiconductor Electronics II, Rheinisch-Westfailsche Technische Hochschule, Sommerfelds
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FACSKO Stefan
Institute of Semiconductor Electronics II, Rheinisch-Westfailsche Technische Hochschule, Sommerfelds
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KURZ Heinrich
Institute of Semiconductor Electronics II, Rheinisch-Westfailsche Technische Hochschule, Sommerfelds
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Kurz Heinrich
Institut Fur Halbleitertechnik Rwth Aachen
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Hyot Berangere
Laboratoir D'electronique De Technologie Et D'instrumentation
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Trappe Cyril
Institute Of Semiconductor Electronics Ii Rheinisch-westfailsche Technische Hochschule Sommerfeldstr
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Winkler Olaf
Institute Of Semiconductor Electronics Ii Rheinisch-westfailsche Technische Hochschule Sommerfeldstr
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Facsko Stefan
Institute Of Semiconductor Electronics Ii Rheinisch-westfailsche Technische Hochschule Sommerfeldstr
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Bechevet Bernard
Laboratoir D'electronique De Technologie Et D'instrumentation
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Bechevet Bernard
Cea
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Kurz Heinrich
Institut für Halbleitertechnik, RWTH Aachen, D-52074 Aachen, Germany
関連論文
- Recrystallization Dynamics of Phase Change Optical Disks with a Nitrogen Interface Layer
- Coulomb Blockade Effects in a Highly Doped Silicon Quantum Wire Fabricated on Novel Molecular Beam Epitaxy Grown Material
- Real Time Measurements of Phase Change Dynamics
- Bloch Oscillations in Semiconductor Superlattices
- Influence of Hot Carrier Diffusion on the Density Limitation of Optical Data Storage
- Thermal Relaxation Phenomena in the Formation of Device-Quality SiO_2/Si Interfaces
- New Trends and Technical Challenges in Optical Storage (Invited Review Paper)
- Influence of Hot Carrier Diffusion on the Density Limitation of Optical Data Storage
- Real Time Measurements of Phase Change Dynamics