Real Time Measurements of Phase Change Dynamics
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概要
- 論文の詳細を見る
- 1998-04-01
著者
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Kurz H
Rwth Aachen Aachen Deu
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TRAPPE Cyril
Institute of Semiconductor Electronics II, Rheinisch-Westfailsche Technische Hochschule, Sommerfelds
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BECHEVET Bernard
Laboratoir d'Electronique de Technologie et d'Instrumentation
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FACSKO Stefan
Institute of Semiconductor Electronics II, Rheinisch-Westfailsche Technische Hochschule, Sommerfelds
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KURZ Heinrich
Institute of Semiconductor Electronics II, Rheinisch-Westfailsche Technische Hochschule, Sommerfelds
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Kurz Heinrich
Institut Fur Halbleitertechnik Rwth Aachen
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Trappe Cyril
Institute Of Semiconductor Electronics Ii Rheinisch-westfailsche Technische Hochschule Sommerfeldstr
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Facsko Stefan
Institute Of Semiconductor Electronics Ii Rheinisch-westfailsche Technische Hochschule Sommerfeldstr
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Bechevet Bernard
Laboratoir D'electronique De Technologie Et D'instrumentation
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Bechevet Bernard
Cea
関連論文
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- Influence of Hot Carrier Diffusion on the Density Limitation of Optical Data Storage
- Thermal Relaxation Phenomena in the Formation of Device-Quality SiO_2/Si Interfaces
- New Trends and Technical Challenges in Optical Storage (Invited Review Paper)
- Real Time Measurements of Phase Change Dynamics