Kerr Rotation Angle versus Gobalt Sublattice Magnetic Moment in RE-Co Sputtered Films : Magnetism, Magnetic Materials and Devices
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概要
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Kerr rotation angles, θ_K, at 780 nm of an optical wavelength, λ, are measured at room temperature for RE(Gd, Tb, Dy, Nd)-Co sputtered films in a wide range of RE content. The absolute rotation angle |θ_K| decreases linearly with an increase in RE content. This compositional dependence of θ_K is analyzed using the mean field theory. From this analysis, it is found that the absolute value of θ_K is proportional to the Co sublattice magnetic moment, M_<C_o>, with the coefficient of about 3.3 × 10^<-4> deg・cm^3 / emu at λ = 780 nm. This linear relation indicates that θ_K of RE-Co films arises mainly from the Co moment, M_<C_o>, at this wavelength. Furthermore, the Kerr rotations of Co-Ti, Co-Zr and Co-Cr sputtered films are measured. They are also proportional to the saturation magnetization, M_s, with the coefficients of values nearly equal to those of RE-Co films.
- 社団法人応用物理学会の論文
- 1988-11-20
著者
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Honda Shigeo
Department Of Physical Electronics Faculty Of Engineering Hiroshima University
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Honda Shigeo
Department Of Applied Phsics Osaka City University:(present Address) Department Of Electronics Hiros
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YOSHIYAMA Masatoshi
Department of Physical Electronics, Faculty of Engineering, Hiroshima University
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Yoshiyama M
Department Of Physical Electronics Faculty Of Engineering Hiroshima University
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Yoshiyama Masatoshi
Department Of Physical Electronics Faculty Of Engineering Hiroshima University
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