Perpendicular Coercivity of Co-Cr Films
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概要
- 論文の詳細を見る
In order to explain the mechanism of the perpendicular coercivity of Co-Cr films, a new model of the microstress distribution has been established based on the structure observed elsewhere. The microstrain measured by an X-ray diffraction technique, the Warren-Averbach method, is considered to contribute to the perpendicular coercivity through the magnetostrictive effect upon magnetic wall displacement ; then a relationship between the perpendicular coercivity and the microstrain is induced. The theoretical results are compared with experimental values of the perpendicular coercivity. In addition, the mechanism of the magnetization reversal is discussed.
- 社団法人応用物理学会の論文
- 1991-10-15
著者
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UCHIYAMA Yasushi
Department of Electronic Engineering, Faculty of Engineering, Osaka University
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SATO Hiroshi
Electrotechnical Laboratory
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UCHIYAMA Yoichi
R&D Center, Digital Equipment Corporation Japan
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SATO Hiroshi
R&D Center, Digital Equipment Corporation Japan
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HWANG Uee-Myung
R&D Center, Digital Equipment Corporation Japan
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Sato H
National Inst. Advanced Industrial Sci. And Technol. (aist) Ibaraki Jpn
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KITAMOTO Yoshitaka
R&D Center, Digital Equipment Corporation Japan
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Uchiyama Yasushi
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Kitamoto Yoshitaka
R&d Center Digital Equipment Corporation Japan
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Hwang Uee-myung
R&d Center Digital Equipment Corporation Japan
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