Spectral Broadening Error Caused by the Specularly Reflected Beams from Channel Wall in Laser Doppler Velocimetry
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概要
- 論文の詳細を見る
Theoretical and experimental investigations were carried out in respect to the influence of spurious spectra caused by specular reflection in laser Doppler velocimetry. In the measurement of the flow in a thin channel, the multiply reflected beams from channel walls work as incident beams to moving scatterers. The resultant scattered light, whose frequency is shifted by the Doppler effect, causes spurious spectra. The frequencies of the spurious spectra caused by specular reflection are closely related to the geometrical arrangement of the reflecting media such as channel walls. On the other hand, the frequencies are absolutely independent on the position of photodetector and the aperture size of receiving optics. These characteristics are entirely different from the spurious spectra caused by the scattered light from channel walls. The spurious spectra by specular reflection cause the spectral broadening and increase the ambiguity of the Doppler frequency, and its influence cannot be ignored when the receiving optical system is arranged in the backscattering region.
- 社団法人応用物理学会の論文
- 1990-06-20
著者
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Okada E
Department Of Electrical Engineering Faculty Of Science And Technology Keio University
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Okada Eiji
Department Of Electrical Engineering Faculty Of Engineering Himeji Institute Of Technology
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Fukuoka Yutaka
Department Of Electrical Engineering Faculty Of Science And Technology Keio University
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Minamitani Haruyuki
Department Of Applied Physics And Physico-informatics Faculty Of Science And Technology Keio Univers
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NAKAJYO Yoshitaka
Department of Electrical Engineering, Faculty of Science and Technology, Keio University
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YAUCHI Hitoshi
Alps Electric Co., Ltd.
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Yauchi Hitoshi
Alps Electric Co. Ltd.
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Nakajyo Yoshitaka
Department Of Electrical Engineering Faculty Of Science And Technology Keio University
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Okada Eiji
Department Of Chemistry Faculty Of Science And Technology Keio University
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Okada Eiji
Department of Applied Chemistry, Faculty of Engineering, Hiroshima University
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