Reliability Test on One-Side-Recordable Magnetooptical Disks by Block Error Rate Measurement
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概要
- 論文の詳細を見る
One-sided magnetooptical (MO) disks of compact-disc size have been evaluated with respect to their reliability by block error rate (BLER) measurement. We have carried out high-temperature and high-humidity tests on our disks. No marked changes in mechanical properties or carrier-to-noise ratio (CNR) after accelerated tests were observed. However, C1 and C2 error count increases were observed. The C2 error count increase indicated increase on large media defect numbers. An Arrhenius plot on the maximum BLER values at elevated temperatures revealed an activation energy of approximately 0.9 eV. Estimated lifetimes of our disks at 31℃ are more than 10 years, which means one-sided MO disks have lifetimes as long as two-sided disks, such as the 130-mm MO disk.
- 社団法人応用物理学会の論文
- 1992-02-28
著者
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Kawasaki S
Faculty Of Science Saitama University
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Kawasaki Sunao
Faculty Of Science Kanazawa University
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Katsuda Shinichi
Personal Computers & Communications Development Laboratories Nec Corporation
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KAWASAKI Satoshi
Research & Development Laboratory, NEC Home Electronics, Ltd.
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ISHIZUKA Kenichi
Research & Development Laboratory, NEC Home Electronics, Ltd.
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KATSUDA Shinichi
Research & Development Laboratory, NEC Home Electronics, Ltd.
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Ishizuka Kenichi
Personal Computers & Communications Development Laboratories Nec Corporation
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