Field Ion-Scanning Tunneling Microscope Equipped with Molecular Beam Epitaxy and Its Application to Study Semiconductor Surface Structure
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1993-03-30
著者
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MIWA Shiro
Angstrom Technology Partnership (ATP)
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Miwa S
Joint Res. Center For Atom Technol. Tsukuba Jpn
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Miwa Shiro
Okinawa Memorial Institute For Medical Research
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Hashizume Tomihiro
Imr Tohoku University
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Morita Etsuro
Central Research Institute Mitsubishi Materials Corporation
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MIWA Shiro
Sony Corporation Research Center
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HAGA Yasuhiko
Sony Corporation Research Center
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MORITA Etsuo
Sony Corporation Research Center
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ARAKAWA Seiichi
Sony Corporation Research Center
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HASHIZUME Tomihiro
IMR, Tohoku University
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SAKURAI Toshio
IMR, Tohoku University
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Morita E
Mitsubishi Materials Silicon Co. Ltd.
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Haga Y
Meisei Univ. Tokyo Jpn
関連論文
- Characterization of ZnSe/GaAs(001) Heteroepitaxial Interfaces by X-Ray Reflectivity Measurement
- A New Glucose-6-Phosphate Dehydrogenase Variant G6PD Sugao (826C→T) Exhibiting Chronic Hemolytic Anemia With Episodes of Hemolytic Crisis Immediately After Birth
- Hemolytic crisis after excessive ingestion of fava beans in a male infant with G6PD Canton
- Changes of Adenine Nucleotides in Erythrocyte Deproteinized Extract after One-Month Storage
- A Novel Nonsense Mutation with a Compound Heterozygous Mutation in TGFBI Gene in Lattice Corneal Dystrophy Type I
- Effect of Crystal Pulling Rate on Formation of Crystal-Originated "Particles" on Si Wafers
- Crystal-Originated Singularities on Si Wafer Surface after SCl Cleaning
- Field Ion-Scanning Tunneling Microscope Equipped with Molecular Beam Epitaxy and Its Application to Study Semiconductor Surface Structure
- Apoptotic Changes Precede Mitochondrial Dysfunction in Red Cell-type Pyruvate Kinase Mutant Mouse Erythroleukemia Cell Lines
- Non-Contact and Non-Destructive Measurement of Carrier Concentration of Nitrogen-Doped ZnSe by Reflectance Difference Spectroscopy
- Structural Change of As-Stabilized GaAs(001)-(2 × 4) and -e(4 × 4)Induced by Zinc Exposure
- Quantitative Analysis of Surface Contaminations on Si Wafers by Total Reflection X-Ray Fluorescence
- Transmission Electron Microscopic Observation of Microdefectsin Zn^+ : Implanted GaAs
- Formation of Gallium Nitride at the Interface between Silicon Nitride Encapsulant and Ion Implanted GaAs
- Evaluation of the blue formazan spot test for screening glucose 6 phosphate dehydrogenase deficiency
- Physiological significance and molecular genetics of red cell enzymes involved in the ribonucleotide metabolism
- Characterization of ZnSe/GaAs(001) Heteroepitaxial Interfaces by X-Ray Reflectivity Measurement