Interference Electron Microscopy by Means of Holography
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1979-12-05
著者
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Endo J
Advanced Research Laboratory Hitachi Ltd
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Endo Junji
Institute Of Industrial Science University Of Tokyo:core Research For Evolutional Science And Techno
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Endo Junji
Central Research Laboratory Hitachi Ltd.
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MATSUDA Tsuyoshi
Central Research Laboratory, Hitachi Ltd.
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TONOMURA Akira
Central Research Laboratory, Hitachi Ltd.
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Tonomura A
Frontier Research System The Institute Of Physical And Chemical Research (riken)
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Tonomura A
Hitachi Ltd. Jpn
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Endo Junji
Advanced Research Laboratory Hitachi Ltd
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Matsuda Tsuyoshi
Frontier Research System The Institute Of Physical And Chemical Research (riken)
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Matsuda Tsuyoshi
Central Research Laboratory Hitachi Ltd.
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Tonomura Akira
Central Rasearch Lab Hitachi Ltd.
関連論文
- Profile structure of magnetic flux lines in type-II superconductor from a rectangular electron hologram
- Time-resolved observation in transmission electron microscopy by means of spatially resolved electron correlation spectroscopy
- Observation of a 0.055 nm Spacing Lattice Image in Gold using a Field Emission Electron Microscope
- Observation of Atomic Steps by Reflection Electron Holography : Techniques, Instrumentations and Measurement
- Interference Electron Microscopy by Means of Holography
- Spherical-Aberration Correction of an Electron Lens by Holography
- High Resolution Electron Holography with Field Emission Electron Microscope
- Degradation of Dithiocarbamate Fungicide Polycarbamate in Upland Soils
- Electron Energy Loss of Rare Earth Vanadates:RVO_4(R=Sc,Y,La,Eu and Gd)
- Fabrication of Micromechanical Tunneling Probes and Actuators on a Silicon Chip
- A Digital-to-Analog Converter of Displacement by an Integrated Micromechanism
- Hologram-Shifting Method for High-Speed Electron Hologram Reconstruction
- Real-Time Observation of the Interaction between Flux Lines and Defects in a Superconductor by Lorentz Microscopy
- Direct Evidence of the Anisotropic Structure of Vortices Interacting with Columnar Defects in High-Temperature Superconductors through the Analysis of Lorentz Images
- Development of a 1 MV field-emission transmission electron microscope
- Electron Holographic Interference Micrograph of a Single Magnetic-Domain Particle
- Observation of Magnetization Structure on Co-Cr Perpendicular Magnetic Recording Media by Bitter and Electron Holography Methods
- Domain Nucleation and Annihilation in Uniformly Magnetized State under Current Pulses in Narrow Ferromagnetic Wires
- Current-Excited Magnetization Dynamics in Narrow Ferromagnetic Wires
- Variable Interference Azimuth Angle in Double-Biprism Electron Interferometry
- Optical system for double-biprism electron holography
- Direct observation of interaction of vortices and antivortices in a superconductor by Lorentz microscopy
- High-Resolution Holography Observation of H-Nb_2O_5
- A New Method for Micro-Area Electron Diffraction by Electron Holography
- Video-Rate Electron-Holographic Interference Microscopy Using a Liquid-Crystal Panel
- Observation of Lattice Images with a Field Emission Electron Microscope
- High Resolution Electron Microscopy by an Incoherent Illumination Method
- The Electron Interference Method for Magnetization Measurement of Thin Films
- Two Beam Interference with Field Emission Electron Beam
- Mean Free Path of Fast Electrons for Plasmon Excitation in a Single Crystal
- Optimum Design of Accelerating Electrodes for a Field Emission Electron Gun
- Optical Reconstruction of Image from Fraunhofer Electron-Hologram
- Off-Axis Electron Micro-Holography
- Electron Microholography by Two-Beam Method
- Domain Nucleation and Annihilation in Uniformly Magnetized State under Current Pulses in Narrow Ferromagnetic Wires
- Current-Excited Magnetization Dynamics in Narrow Ferromagnetic Wires
- Fabrication of Micromechanical Tunneling Probes and Actuators on a Silicon Chip