The Diffusion Study Titanium-Silver System

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1964-10-15

著者

• KAWABE Hideaki

  Department of Precision Engineering, Faculty of Engineering, Osaka University

• Kawabe Hideaki

  Department Of Applied Physics Faculty Of Engineering Osaka University

• Shinoda Gunji

  Department Of Applied Physics Faculty Of Engineering Osaka University

関連論文

• Measurement of Residual Stress in Bent Silicon Wafers by Means of Photoluminescence
• Oxygen-Related Donors Stable at 700-800℃ in CZ-Si Crystals
• Oxygen-Related Donors Generated at 800℃ in CZ-Si
• Strain Measurement by Double Diffraction Method
• Light Source System for Ruby Laser
• Fracture of GaAs Wafers : Mechanical and Acoustical Properties
• The Diffusion Study Titanium-Silver System
• Weibull Distribution of X-Ray Pulse-Height
• A Study on Electron Diffusion in X-ray Microanalyzer Specimen
• Mechanical Properties of Heat-treated CZ-Si Wafers from Brittle to Ductile Temperature Range

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