Extended AC Conductance-Bias Method Considering Semiconductor Conductance and Capacitance in MOS Structure

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1980-07-05

著者

• WARASHINA Masatoshi

  Institute of Space and Astronautical Science

• Ohnishi Kazunori

  College Of Science And Engineering Nihon University

• USHIROKAWA Akio

  Institute of Space and Aeronautical Science, University of Tokyo

• Warashina Masatoshi

  Institute Of Space And Aeronautical Science University Of Tokyo

• Ushirokawa Akio

  Institute Of Space And Aeronautical Science University Of Tokyo

関連論文

• Photoluminescence Due to Degenerate Electron-Hole System in Silicon-on-Insulator Wafers under Ultraviolet Light Excitation
• Deep-Level Luminescence in Czochralski-Grown Silicon Crystals after Long-Term Annealing at 450℃
• Extended AC Conductance-Bias Method Considering Semiconductor Conductance and Capacitance in MOS Structure
• Spectral Shape Analysis of Photoluminescence Excitation in Semiconductors
• Avalanche Injection Effects in MIS Structures and Realization of N-Channel Enhancement Type MOS FETS
• 2-Dimensional Parameter Conductance Method for Estimation of Interface States in MIS Structure
• Difference of Characteristics of a-si : H Solar Cells between under Illumination and Dark : III-3: AMORPHOUS SOLAR CELLS (2) : Characterization
• Conductance(G)-Bias(L) Method for Interface States in MUS Structure
• Measuring Methods of Solar Cell Parameters Using Spectrum Response of Short-Circuit Current : I-3: CHARACTERIZATION OF SOLAR CELLS
• Simple Method for the Determination of Series Resistance and Maximum Power of Solar Cell : III-2: II-VI COMPOUND SOLAR CELLS AND OTHERS
• Photoluminescence Due to Degenerate Electron-Hole System in Silicon-on-Insulator Wafers under Ultraviolet Light Excitation

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