Unusual Features of Field-Ion Microscope Image at 4.2 K
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1974-03-05
著者
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Nakamura Shogo
The Institute Of Scientific And Industrial Research Osaka University:kumamoto National College Of Te
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Adachi Toshiyuki
The Institute Of Scientific And Industrial Research Osaka University
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OHNISHI Kazuhito
The Institute of Scientific and Industrial Research, Osaka University
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Ohnishi Kazuhito
The Institute Of Scientific And Industrial Research Osaka University
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Nakamura Shogo
The Institute Of Scientific And Industrial Research Osaka University
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- Si (111)(√×√)-Al Surface Studied by Angle-Resolved Electron-Energy-Loss Spectroscopy
- Electron Spin Resonance Study of the g〜1.96 Signal of Zinc Oxide
- Unusual Features of Field-Ion Microscope Image at 4.2 K
- X-Ray Photoemission Study of the Oxidation process at Cleaved (110) Surfaces of GaAs, GaP and InSb
- Resolution of the Field-Ion Microscope