Resolution of the Field-Ion Microscope

概要

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The resolution of the field-ion microscope image for tungsten surface is measured as a function of temperature, tip curvature and dimension of imaging gas molecules. The resolutions obtained for He gas are slightly higher than those calculated from the Miiller and Tsong's theory using the diameter of outer orbital for the dimension of the imaging gas molecules, and for Ne and H_2 are in agreement with the theoretical ones. The nearest neighbour, 2.74Å, atom chains across the edges of {112} planes can be resolved at 120 K with He, but on the other net planes it can never be resolved even at 21 K. A reason why the experimental resolutions are different among each net plane is discussed.
社団法人応用物理学会の論文
1972-03-05