Observation of Pips Formed on Ag/SnO_2 Contacts in DC14V-20A Resistive Circuit(Session 8 : Automotive Application)
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概要
- 論文の詳細を見る
We tested Ag/SnO_212wt% contacts mounted on electromagnetic relay in the resistive circuit of DC14V-20A as make-only-contacts, and took pictures of transferred pips formed on cathode surface. In this experiment, we predict that if the relation of "H/Dr>=0.5 and H/Ga>0.5" is realized, the possibility that sticking will happen at contacts is very high, when the movable side of contacts is cathode. Where H is height of pip, Dr is thickness of pip (diameter of root of pip), and Ga is gap length of contacts. We also find situations of growth are different when the movable side is anode.
- 社団法人電子情報通信学会の論文
- 2004-10-15
著者
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Kubono Takayoshi
Faculty Of Engineering Shizuoka Univ.
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SEKIKAWA Junya
Faculty of Engineering, Shizuoka University
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Kubono Takayoshi
Shizuoka Univ. Hamamatsu‐shi Jpn
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Naito Yutaka
Graduate School Of Science And Engineering Shizuoka Univ.
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ITO Tomoya
Graduate School of Science and Technology, Shizuoka University
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YAMAZAKI Ryo
Graduate School of Science and Technology, Shizuoka University
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Ito Tomoya
Graduate School Of Science And Technology Shizuoka University
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Yamazaki Ryo
Graduate School Of Science And Technology Shizuoka University
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Yamazaki Ryo
Laboratory Of Regional Landscape Planning College Of Agriculture Osaka Prefecture University
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Sekikawa Junya
Faculty Of Engineering And Design Kyoto Institute Of Technology
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Yamazaki Ryo
Graduate School Of Science And Technology Chiba University
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