Two-Sapphire-Rod-Resonator Method to Measure the Surface Resistance of High-T_c Superconductor Films(General Methods, Materials, and Passive Circuits)(<Special Section>Advances in Characterization and Measurement Technologies for Microwave and Millimeter-
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概要
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copyright(c)2004 IEICE許諾番号：07RB0174 http://www.ieice.org/jpn/trans_online/index.htmlPrecise designs are presented for sapphire rod resonators of three types, which have been proposed by the IEC/TC90/WG8 in the standard measurement method of the surface resistance R_s of high-T_c superconductor (HTS) films; an open-type, a cavity-type and a closed-type. In order to separate TE_<011> and TE_<013> modes, which are used in Rs measurements, from the other modes, appropriate dimensions for these three resonators are determined from mode charts calculated from a rigorous analysis based on the mode matching method, taking account of an uniaxialanisotropic characteristic of sapphire. Comparison of the open-type resonator with the closed-type is performed. For the open-type, the unloaded Q values of both the TE_<011> and TE_<013> modes are reduced by radiations of a leaky state TM_<310> mode. Finally, validity of the design and a two-sapphirerod-resonator method will be verified by experiments.
- 社団法人電子情報通信学会の論文
- 2004-05-01
著者
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Kobayashi Yoshio
Faculty Of Engineering Saitama University
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Hashimoto Toru
Faculty Of Engineering Saitama University
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Kobayashi Yoshio
Faculty Of Engineering Ibaraki University
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小林 禧夫
Faculty of Engineering, Saitama University
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