Kobayashi Yoshio | Faculty Of Engineering Ibaraki University

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• KOBAYASHI Yoshioの詳細を見る
• 同名の論文著者
• Faculty Of Engineering Ibaraki Universityの論文著者

関連著者

• Kobayashi Yoshio

  Faculty Of Engineering Ibaraki University

• 小林 禧夫

  Faculty of Engineering, Saitama University

• Kobayashi Yoshio

  Faculty Of Engineering Saitama University

• KOBAYASHI Yoshio

  Faculty of Engineering, Saitama University

• Kobayashi Y

  The Department Of Electrical And Electronic Systems Saitama University

• Hashimoto Toru

  Faculty Of Engineering Saitama University

• MA Zhewang

  Faculty of Engineering, Saitama University

• Ma Zhewang

  Faculty Of Engineering Saitama University

• KAWABATA Hirokazu

  Faculty of Engineering, Saitama University

• TANPO Hiroshi

  Faculty of Engineering, Saitama University

• Tanpo Hiroshi

  Faculty Of Engineering Saitama University

• Kawabata Hirokazu

  Faculty Of Engineering Saitama University

• Imai Tadashi

  Faculty Of Engineering Saitama University

• Shimizu Takashi

  Faculty Of Engineering Saitama University

• 馬 哲旺

  Faculty of Engineering, Saitama University

• ANDO Toshihiro

  Core Research for Evolutional Science and Technology (CREST) of Japan Science and Technology Corpora

• ANDO Toshihiro

  National Institute for Materials Science (NIMS)

• Satoh Kei

  Ntt Docomo Inc. Wireless Laboratories

• Ando Toshihiro

  Core Research For Evolutional Science Technology (crest)

• Ando Toshihiro

  National Institute For Research In Inorganic Materials (nirim)

• Suzuki Hideyuki

  Faculty of Information and Computer Sciences, Toyohashi University of Technology

• NOJIMA TOSHIO

  Radio Environment Technology Research Laboratory, NTT DoCoMo, Inc.

• Eguchi Mika

  Faculty Of Engineering Ibaraki University

• SATOH Kei

  Wireless Laboratories, NTT DoCoMo, Inc.

• NARAHASHI Shoichi

  Wireless Laboratories, NTT DoCoMo, Inc.

• NOJIMA Toshio

  Wireless Laboratories, NTT DoCoMo, Inc.

• Nojima Toshio

  Radio Environment Technology Research Laboratory Ntt Docomo Inc.

• Nojima Toshio

  Wireless Laboratories Ntt Docomo Inc.

• Kobayashi Yoshio

  Saitama Univ. Saitama‐shi Jpn

• KOGAMI Yoshinori

  Faculty of Engineering, Utsunomiya University

• Imai T

  The Authors Are With Ntt Mobile Communications Network Inc.

• Nojima T

  Graduate School Of Information Science And Technology Hokkaido University

• Katoh Masayuki

  Faculty Of Engineering Mie University

• Katoh Masayuki

  Faculty Of Engineering Saitama University

• Imai Tadashi

  Faculty of Engineering, Saitama University

• Uno Katsuhiro

  Faculty Of Engineering Ibaraki University

• Ando Toshihiro

  National Institute For Materials Science

• Kogami Yoshinori

  Faculty Of Engineering Utsunomiya University

• Narahashi Shoichi

  Wireless Laboratories Ntt Docomo Inc.

• Sakakibara T

  Toshiba Corp.

• Yamamoto Shun

  Graduate School Of Science And Engineering Ibaraki University

• KIKUCHI Mayuko

  Graduate School of Engineering, Toyo University

• NISHITANI GAMO

  Faculty of Science and Engineering, Toyo University

• Nishitani Gamo

  Faculty Of Science And Engineering Toyo University

• Kikuchi Mayuko

  Graduate School Of Engineering Toyo University

• Sakakibara Takaaki

  Faculty of Engineering, Saitama University

• Suzuki Hideyuki

  Faculty Of Engineering Saitama University

• Shimizu Takashi

  Faculty Of Engineering Shizuoka University

• Tamura Hiroshi

  Murata Manufacturing Co. Lid.

• Tamura Hiroshi

  Murata Manufacturing Co. Ltd.

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著作論文

• A Low-Loss 5 GHz Bandpass Filter Using HTS Quarter-Wavelength Coplanar Waveguide Resonators(Special Issue on Superconductive Electronics)
• Analysis and Experiments of a TM_ Mode Cylindrical Cavity to Measure Accurate Complex Permittivity of Liquid(General Methods, Materials, and Passive Circuits)(Advances in Characterization and Measurement Technologies for Microwave an
• An Improvement of the Perturbation Method Using a TM_ Mode Cylindrical Cavity(Measurement)(Recent Trends on Microwave and Millimeter Wave Application Technology)
• Phenomenological Description of Temperature and Frequency Dependence of Surface Resistance of High-T_C Superconductors by Improved Three-Fluid Model
• Characterization of Multi-Walled Carbon Nanotube-Supported Pt Catalyst Prepared by Metal Nanocolloidal Solution for a Polymer Electrolyte Fuel Cell Catalyst
• Precise Measurement for Temperature Dependence of Dielectric Rod Materials Using an Image-Type Resonator Method (Special Issue on Measurement Techniques for Microwave/Millimeter Wave)
• Microwave Characteristics of High-T_c Superconductors by Improved Three-Fluid Model (Special Issue on High-Temperature Superconducting Electronics)
• Development of a Millimeter-Wave Coaxial Cable Measurement System at Cryogenic Temperature and Measurement of the Surface Resistance of High-T_c Superconductor Films(Special Issue on Superconductive Electronics)
• Frequency Dependence Measurements of Surface Resistance of Superconductors Using Four Modes in a Sapphire Rod Resonator(Special Issue on Microwave and Millimeter Wave Technology)
• Two-Sapphire-Rod-Resonator Method to Measure the Surface Resistance of High-T_c Superconductor Films(General Methods, Materials, and Passive Circuits)(Advances in Characterization and Measurement Technologies for Microwave and Millimeter-
• Design of a Grooved Circular Cavity for Dielectric Substrate Measurements in Millimeter Wave Region(Special Issue on Microwave and Millimeter Wave Technology)
• Round Robin Test on a Dielectric Resonator Method for Measuring Complex Permittivity at Microwave Frequency (Special Issue on Measurement Techniques for Microwave/Millimeter Wave)
• Cut-Off Circular Waveguide Method for Dielectric Substrate Measurements in Millimeter Wave Range(General Methods, Materials, and Passive Circuits)(Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave
• Standardization of Measurement Methods of Low-Loss Dielectrics and High-Temperature Superconducting Films(Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)

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