Standardization of Measurement Methods of Low-Loss Dielectrics and High-Temperature Superconducting Films(<Special Section>Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
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copyright(c)2004 IEICE許諾番号：07RB0174The present state of IEC and JIS standards is reviewed on measurement methods of low-loss dielectric and high-tempera-ture super-conductor (HTS) materials in the microwave and millimeter wave range. Four resonance methods are discussed actually, that is, a two-dielectric resonator method for dielectric rod measurements, a two-sapphire resonator method for HTS film measurements, a cavity resonator method for microwave measurements of dielectric plates and a cutoff circular waveguide method for millimeter wave measurements of dielectric plates. These methods realize the high accuracy sufficient for measurements of temperature dependence of material properties.
- 一般社団法人電子情報通信学会の論文
- 2004-05-01
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