Frequency Dependence Measurements of Surface Resistance of Superconductors Using Four Modes in a Sapphire Rod Resonator(Special Issue on Microwave and Millimeter Wave Technology)
スポンサーリンク
概要
- 論文の詳細を見る
copyright(c)2003 IEICE許諾番号：07RB0174 http://www.ieice.org/jpn/trans_online/index.htmlThe frequency dependence of surface resistance R_s of high temperature superconductor (HTS) films are measured by a novel measurement method using four TE_<0mp> modes in a sapphire rod resonator. At first, a loss tangent tan δ of the sapphire rod and R_s of the HTS films are evaluated separately from the results measured for the TE_<021> and TE_<012 >modes with close resonant frequencies. Secondly, R_s values at two different resonant frequencies for the TE_<011> and TE_<022> modes are measured using a well-known relation for sapphire tan δ/f = constant, where f is a frequency. R_s values of HoBa_2Cu_3O_<7-x> thin films were measured in the frequency range of 10 to 43 GHz by using four sapphire rod resonators with different sizes. As a result, it is found that these measured results of R_s have a characteristic of frequency square.
- 社団法人電子情報通信学会の論文
- 2003-08-01
著者
-
Kobayashi Yoshio
Faculty Of Engineering Saitama University
-
Hashimoto Toru
Faculty Of Engineering Saitama University
-
Kobayashi Yoshio
Faculty Of Engineering Ibaraki University
-
小林 禧夫
Faculty of Engineering, Saitama University
関連論文
- A Low-Loss 5 GHz Bandpass Filter Using HTS Quarter-Wavelength Coplanar Waveguide Resonators(Special Issue on Superconductive Electronics)
- Analysis and Experiments of a TM_ Mode Cylindrical Cavity to Measure Accurate Complex Permittivity of Liquid(General Methods, Materials, and Passive Circuits)(Advances in Characterization and Measurement Technologies for Microwave an
- An Improvement of the Perturbation Method Using a TM_ Mode Cylindrical Cavity(Measurement)(Recent Trends on Microwave and Millimeter Wave Application Technology)
- Phenomenological Description of Temperature and Frequency Dependence of Surface Resistance of High-T_C Superconductors by Improved Three-Fluid Model
- Characterization of Multi-Walled Carbon Nanotube-Supported Pt Catalyst Prepared by Metal Nanocolloidal Solution for a Polymer Electrolyte Fuel Cell Catalyst
- Precise Measurement for Temperature Dependence of Dielectric Rod Materials Using an Image-Type Resonator Method (Special Issue on Measurement Techniques for Microwave/Millimeter Wave)
- Microwave Characteristics of High-T_c Superconductors by Improved Three-Fluid Model (Special Issue on High-Temperature Superconducting Electronics)
- Development of a Millimeter-Wave Coaxial Cable Measurement System at Cryogenic Temperature and Measurement of the Surface Resistance of High-T_c Superconductor Films(Special Issue on Superconductive Electronics)
- Frequency Dependence Measurements of Surface Resistance of Superconductors Using Four Modes in a Sapphire Rod Resonator(Special Issue on Microwave and Millimeter Wave Technology)
- Two-Sapphire-Rod-Resonator Method to Measure the Surface Resistance of High-T_c Superconductor Films(General Methods, Materials, and Passive Circuits)(Advances in Characterization and Measurement Technologies for Microwave and Millimeter-
- Design of a Grooved Circular Cavity for Dielectric Substrate Measurements in Millimeter Wave Region(Special Issue on Microwave and Millimeter Wave Technology)
- Round Robin Test on a Dielectric Resonator Method for Measuring Complex Permittivity at Microwave Frequency (Special Issue on Measurement Techniques for Microwave/Millimeter Wave)
- Cut-Off Circular Waveguide Method for Dielectric Substrate Measurements in Millimeter Wave Range(General Methods, Materials, and Passive Circuits)(Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave
- Standardization of Measurement Methods of Low-Loss Dielectrics and High-Temperature Superconducting Films(Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)