Wide-Band CDMA Distortion Characteristics of an AlGaAs/InGaAs/AlGaAs Heterojunction FET under Various Quiescent Drain Current Operations (Special Issue on High-Frequency/speed Devices in the 21st Century)
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概要
- 論文の詳細を見る
Wide-band CDMA (W-CDMA) distortion characteristics of a fabricated double-doped heterojunction FET (HJFET) are presented. Measured results demonstrate that the first and second adjacent channel W-CDMA adjacent channel leakage power ratios (ACPRs) of the HJFET are correlated to the third-and fifth-order intermodulation (IM3 and IM5) distortions respectively under various quiescent drain current operation (I_q). A first channel ACPR dip phenomenon is observed under a low I_q. condition, resulting in improved power added efficiency. Due to its close correlation to the IM3 distortion, the ACPR dip phenomenon is explained in terms of the similar IM3 characteristic. Simulated results reveal that the dip is a consequence of the cancellation of distortions generated by the third-and fifth-order nonlinearities at the IM3 frequency. The conditions for the cancellation are detailed.
- 社団法人電子情報通信学会の論文
- 1999-11-25
著者
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Hau Gary
Kansai Electronics Research Laboratories Nec Corporation
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Iwata Naotaka
Kansai Electronics Research Laboratories Nec Corporation
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NISHIMURA Takeshi
Kansai Electronics Research Laboratories, NEC Corporation
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Nishimura Takeshi
Kansai Electronics Research Laboratories Nec Corporation
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