Design of a 3.3 V Single Power-Supply 64 Mbit Flash Memory with Dynamic Bit-Line Latch (DBL) Programming Scheme
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概要
- 論文の詳細を見る
A 3.3 V single power-supply 64 Mb flash memory with a DBL programming scheme has been developed and fabricated with 0.4μm CMOS technology. 50 ns access time and 256 b erase/programming unit-capacity have been achieved by using hierarchical word- and bit-line structures and DBL programming scheme. Furthermore in order to lower operating voltage the HiCR cell is used. The chip size is 19.3 mm×13.3 mm.
- 社団法人電子情報通信学会の論文
- 1995-07-25
著者
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Takeshima Toshio
Ulsi Device Development Laboratories Nec Corporation
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Kanamori K
Ulsi Device Development Laboratories Nec Corporation
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Takeshima T
Ulsi Device Development Laboratories Nec Corporation
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Takada H
Mitsubishi Electric Corp. Hyogo Jpn
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Sugawara Hiroshi
ULSI Device Development Laboratories, NEC Corporation
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Takada Hiroshi
ULSI Device Development Laboratories, NEC Corporation
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Hisamune Yoshiaki
ULSI Device Development Laboratories, NEC Corporation
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Kanamori Kohji
ULSI Device Development Laboratories, NEC Corporation
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Okazawa Takeshi
ULSI Device Development Laboratories, NEC Corporation
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Murotani Tatsunori
ULSI Device Development Laboratories, NEC Corporation
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Sasaki Isao
ULSI Device Development Laboratories, NEC Corporation
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Murotani T
Nec Corp. Sagamihara‐shi Jpn
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Murotani Tatsunori
Ulsi Device Development Laboratories Nec Corporation
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Sugawara Hiroshi
Ulsi Device Development Laboratories Nec Corporation
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Okazawa T
Ulsi Device Development Laboratories Nec Corporation
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Sasaki Isao
Ulsi Device Development Laboratories Nec Corporation
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- Suppression of Rapid Beam Loss at Low Energy by RF Excitation of Betatron Oscillation
- Effects of Increasing Injection Repetition Rate of Low-Energy Injection into a Compact Storage Ring
- Design of a 3.3 V Single Power-Supply 64 Mbit Flash Memory with Dynamic Bit-Line Latch (DBL) Programming Scheme
- BIST Circuit Macro Using Microprogram ROM for LSI Memories
- Hierarchical Word-Line Architecture for Large Capacity DRAMs (Special Issue on Circuit Technologies for Memory and Analog LSIs)
- A Crossing Charge Recycle Refresh Scheme with a Separated Driver Sense-Amplifier for Gb DRAMs (Special Issue on ULSI Memory Technology)