Write Density Limit in Longitudinal thin film media above 50Gb/in^2
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概要
- 論文の詳細を見る
The write density limit is explored by analyzing the magnetic recording process in computer hard disk drives with a micromagnetic model. The digital data with random sequences are recorded in longitudinal media at different densities. A novel method has been utilized to study the write density limit: the simulated read back voltage and the respected superlinearposed isolated pulses are compared to find the distortion in the record process. When a severe distortion shows up, the corresponding areal density is considered as the write density limit. By the novel method, the write density limit is analyzed with different parameters of the thin film write head, the GMR read head and the thin film media.
- 社団法人電子情報通信学会の論文
- 2001-10-31
著者
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WEI Dan
Data Storage Institute
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Liang X
Lab Of Advanced Materials Dept. Of Materials Science And Engineering Tsinghua University
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Li J
Lab. Of Advanced Materials Department Of Materials Science And Engineering Tsinghua University
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Liang Xiaobing
Lab of Advanced Materials, Dept. of Materials Science and Engineering, Tsinghua University
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Wei Dan
Lab of Advanced Materials, Dept. of Materials Science and Engineering, Tsinghua University
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Li Jian
Lab of Advanced Materials, Dept. of Materials Science and Engineering, Tsinghua University
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Wei D
Department Of Environmental Science And Engineering Environment Simulation And Pollution Control Sta
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Wei Dan
Lab Of Advanced Materials Department Of Materials Science And Engineering Tsinghua University
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Liang Xiaobing
Lab Of Advanced Materials Dept. Of Materials Science And Engineering Tsinghua University
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Wei D
Tsinghua Univ. Beijing Chn
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Li Jian
National Laboratory Of Biomacromolecules Institute Of Biophysics Academia Sinica
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