Write Linear Density Limit in Longitudinal Thin Film Media(Special Issue on Recent Progress in Information Storage Technology)
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概要
- 論文の詳細を見る
Write linear density limit is defined to analyze the magnetic recording process in computer hard disk drives at extremely high recording densities. The digital data with pseudo random sequences are recorded numerically in longitudinal media at different densities by a micromagnetic simulation model. A thin film write head and an ideal GMR read head are utilized in the record and read-back process, respectively. A novel method has been utilized to study the write linear density limit: the simulated read back voltage and the respected linear superposed pulses are compared to find the distortion in the record process. When a severe distortion shows up, the corresponding linear density is considered as the write linear density limit. By the novel method, the write linear density limit is analyzed with different parameters of the recording media.
- 社団法人電子情報通信学会の論文
- 2002-10-01
著者
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WEI Dan
Data Storage Institute
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Liang X
Lab Of Advanced Materials Dept. Of Materials Science And Engineering Tsinghua University
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Li J
Lab. Of Advanced Materials Department Of Materials Science And Engineering Tsinghua University
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LI Jian
Lab. of Advanced Materials, Department of Materials Science and Engineering, Tsinghua University
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LIANG Xiaobing
Lab. of Advanced Materials, Department of Materials Science and Engineering, Tsinghua University
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WEI Dan
Lab. of Advanced Materials, Department of Materials Science and Engineering, Tsinghua University
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Wei D
Department Of Environmental Science And Engineering Environment Simulation And Pollution Control Sta
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Wei Dan
Lab. Of Advanced Materials Department Of Materials Science And Engineering Tsinghua University
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Wei D
Tsinghua Univ. Beijing Chn
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Li Jian
National Laboratory Of Biomacromolecules Institute Of Biophysics Academia Sinica
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