433 ナノ構造体評価のための近接場振動スペクトロスコピー(光メカトロニクスII)(OS.6 ナノ構造創成をめざす光メカトロニクスの展開)

概要

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Near-field optical microscopy using an apertureless metallic probe is described. Numerical analysis shows that the electric field is enhancecd locally near the apex by a factor of 80 and that a radius of the tip apex determines a spatial resolution of the microscope which is much smaller than the diffraction limit of the light. Near-field Raman spectroscopy is achieved with 30 nm spatial resolution by employing the locally enhanced field which compensates low cross section of Raman scattering. We have also observed nanometric chemical interaction between the tip and molecules which is revealed by emergence, shift and intensity-enhancement of specific Raman lines. All of the results shows that near-field Raman spectroscopy provides analysis, observation, and evaluation of nanostructures based on nanotechnology.
一般社団法人日本機械学会の論文
2001-03-09