409 フィルム上に形成した透明導電薄膜の損傷進展解析

概要

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The progress of multiple cracking and the change of electric resistance in an indium-tin-oxide (ITO) film deposited onto a polyethylene terephtalate substrate were measured simultaneously during the tensile test. The proportionality relation between the crack density and the electric resistance was obtained. The Monte Carlo simulation was conducted to predict the increase both of the crack density and the electric resistance. In the simulation, stress distributions in film fragments were properly calculated by the elastic-plastic finite element analysis. The predictions showed good agreements with experiments.
社団法人日本機械学会の論文
2003-10-17