白色X線法によるセラミックコーティング界面近傍の残留応力評価

概要

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This paper presents a polychromatic X-ray method for nondestructive evaluation of residual stress distributed in the vicinity of the interface between a ceramic coating layer and a substrate metal. Since the strain is assumed to be a linear function of the depth, the strain distribution along the depth direction can be obtained from the weighted mean strain equation calculated by considering the intensity of diffracted X-rays over the penetration depth. Therefore, the distribution along the depth direction of the residual stress was determined by the strain distributions in two directions : the vertical direction and the inclined direction to the surface. SUS316 coated with TiN by the PVD process was used as the specimen. The residual stress distributions in the coating layer and the substrate of the specimen were evaluated using this method. As a result, not only compressive residual stress in the coating layer but also the stress gradient in the substrate could be confirmed simultaneously and nondestructively.
一般社団法人日本機械学会の論文
1995-06-25