Cr-K_α/α211およびCr-K_β/γ311による二相ステンレス鋼のX線応力測定へのIPの適用

概要

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It is possible to carry out stress measurement by single X-ray incidence using whole part of Debye-Scherrer ring. Yoshioka et al, reported that it is useful for this method to use image plate (IP) for its practical use. There is a possibility to analyze Debye-Scherrer rings of plural phases in composite materials simultaneously exposed on one image plate, as the diffraction rings have the different radius due to the different diffraction angle each other. It will be possible, in these cases, to measure phase stresses, macro- and microstresses by single X-ray exposure. Therefore, we can carry out quicker X-ray stress measurement. In case of the use of chromium K_α radiation to dual phase stainless steel, αFe211 diffraction occurs at 2θ=153.5 deg and γFe311 diffraction at 2θ=146.6 deg is also available if chromium K_β, radiation is used. Through these diffraction experiments, the stress measurement mentioned above will be possible.
社団法人日本機械学会の論文
2003-07-25