優先方位を有する多結晶材料のX線応力解析(<特集>X線材料強度)

概要

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The commonly used X-ray stress measurement, so-called sin^2 ψ method, is valid for the stress determination from the X-ray diffraction data. However, the method fails if the samples are anisotropic because the method is constructed from some assumptions, one of which is that the samples are regarded as isotropic and homogeneous polycrystalline materials. Therefore, in order to be applicable the polycrystalline materials with<HKL>preferred orientation, the method was improved by the introduction of the rotation symmetry about the normal axis to the X-ray diffraction plane in this paper. The basic equation in the X-ray stress measurement i.e.the X-ray stress-lattice strain relation was derived for<HKL>preferred orientation in result. Then, the method applied to a centrifugal casting part, and was discussed in comparison with the sin^2 ψ method.
社団法人日本材料学会の論文
1999-07-15