示差熱分析および高温X線回折によるCa_2SiO_4の研究

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The high temperature powder X-ray diffraction methods and the differential thermal analysis were applied in studying the modifications, ct, α, α', β of 2CaO・SiO_2,which covered the temperature range 25°〜1550℃. These methods have proved to be able to determine distinctly the inversion temperatures during both in the heating as well as in the cooling processes with the following results : A. Heating process. 1) γ-form was stable in the temperatures from 25° to 740℃, giving the X-ray pattern similar to that of 2MgO・SiO_2. 2) α'-form was stable in the temperatures from 900° to 1450℃, giving the X-ray pat-tern similar to that of β-K_2SO_4,and the cell dimensions a=6.883,b=5.605,and c=9.543 a.u. at 1300℃. 3) α-form was stable above 1490℃, giving X-ray pattern similar to that of α-K_2SO_4 (glaserite), and the cell dimensions a=5.27,and c=5.11 a.u. at 1500℃. B. Cooling process. 4) Inversion α-α'-form occurred between 1450° and 1390℃. The intensity of X-ray diffraction of α'-form produced by the inversion of α was slightly different from that produced by heating γ-form. The difference, however, faded away when passing 1190°〜ll50℃. 5) The inversion from α to β-form occurred at 690℃. The X-ray pattern of P-form is the same with that stabilized to room temperature by adding stabilizers, Cr_2O_3,B_20_3. The cell dimensions at 550℃ were a=5.558,b=6,823 and c=11.261 a.u., ∠β=123° 11'. 6) The change from β- to γ-form occurred at 450℃ accompanying the dusting. The unit cells of α , α' and β shown in this paper were P3ml, Pnma and P2_1/c, respectively following the International Tables for X-ray Crystallography (1952).
社団法人日本セラミックス協会の論文
1963-01-01

示差熱分析および高温X線回折によるCa_2SiO_4の研究

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