常圧燒結窒化ケイ素のX線残留応力測定(<小特集>X線材料強度小特集)

概要

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The X-ray elastic constants of sintered silicon nitride were measured for the diffraction plane (323) by using Cu-Kα radiation and for (411) by using Cr-Kα radiation. The values of E/(1+ν) (E=Young's modulus, ν=poisson's ratio) were nearly for both planes, and were larger than the mechanically measured value. The residual stress on the lapped and ground surface was measured both with (323) and (411) diffractions. The measured values were all compression. The compressive stress for (411) plane was three to four times larger than that for (323) plane, which indicated a steep decrease of compression in the subsurface layer. The compressive residual stress in the direction perpendicular to the grinding direction was about twice the value in the grinding direction.
社団法人日本材料学会の論文
1987-08-15