Observation of Layer Structure in Dislocation Free Silicon Crystals with the Use of X-ray Anomalous Transmission

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On the Anomalies of the Small Angle Reflection of Cathode Rays from the Surface of a Single Crystal : Part II. The Investigation on the Causes of the Anomalies
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Observation of Layer Structure in Dislocation Free Silicon Crystals with the Use of X-ray Anomalous Transmission
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X-ray observations on Cleavage Faces of LiF Single Crystals
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Measurement of Anomalous Absorption Coefficients of Electrons for MgO Crystals
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